Titulación | Tipo | Curso |
---|---|---|
4313797 Ingeniería de Telecomunicación / Telecommunication Engineering | OB | 1 |
Puede consultar esta información al final del documento.
In order to achieve the best understanding of syllabus contents, the following background is needed:
• Signal processing
• Circuit theory
• Electronic devices
• Analog CMOS circuits
The aim of this syllabus can be split into two goals:
• Introduction to the design of A/D and D/A data converters in CMOS technologies
• Hands-on experience on the design methodology and EDA tools for mixed-signal and full-custom integrated circuits.
Chapter 1. Introduction to integrated heterogeneous systems
1.1. Evolution of CMOS technologies
1.2. Trends in analog and mixed IC design
1.3. A/D and D/A conversion principles
1.4. ADC and DAC figures of merit
1.5. Lab proposal: My Delta-Sigma ADC in 2.5um CMOS technology (CNM25)
Chapter 2. ADC architectures and CMOS circuits
2.1. ADC classification
2.2. Flash techniques
2.3. Sub-ranging, time-interleaving and pipelining techniques
2.4. Successive-approximation techniques
2.5. Integrating techniques
2.6. Delta-Sigma modulation techniques
2.7. Time-domain techniques
Chapter 3. DAC architectures and CMOS circuits
3.1. DAC classification
3.2. Flash techniques
3.3. Pulse-width modulation techniques
3.4. Delta-Sigma modulation techniques
Chapter 4. Full-Custom IC Design Methodology
4.1. Mixed-Signal Design Flow
4.2. AMS Hardware Description Languages
4.3. Device Sizing
4.4. Process and Mismatching Simulation
4.5. The Art of Analog Layout
4.6. Physical Verification
4.7. Parasitics Extraction
4.8. DFM Techniques
(Seminar about CNM25 design kit)
Chapter 5. CMOS OpAmps
5.1. OpAmp Figures of Merit
5.2. The Mono-Transistor Amplifier
5.3. Differential Circuits with CMFB
5.4. Folded Amplifiers
5.5. Cascode Topologies
5.6. Gain Enhancement Techniques
5.7. Multi-Stage OpAmps
Chapter 6. Delta-Sigma Modulators for ADC
6.1. Oversampling and noise shaping principles
6.2. Architecture selection based on quantization error
6.3. Switched-capacitor CMOS implementations
6.4. Modeling circuit second order effects
6.5. Digitally assisted techniques
6.6. Low-power circuit topologies
Chapter 7. Application to Low-Power Read-Out ICs for Smart Sensors
7.1. High-resolution SC Delta-Sigma ADC for space applications
7.2. Compact pixel integrating ADC for infrared and X-ray imagers
7.3. Potentiostatic CT Delta-Sigma ADC for electrochemical integrated sensors
Título | Horas | ECTS | Resultados de aprendizaje |
---|---|---|---|
Tipo: Dirigidas | |||
Case studies and exercises | 10 | 0,4 | 1, 3, 6, 7 |
Lab sessions | 12 | 0,48 | 1, 2, 3, 6, 7 |
Lectures | 23 | 0,92 | 3, 4, 5, 7 |
Tipo: Supervisadas | |||
Tutorials | 15 | 0,6 | 1, 4, 5, 6 |
Tipo: Autónomas | |||
Lab pre-work | 10 | 0,4 | 1, 2, 4, 5, 6, 7 |
Study | 68 | 2,72 | 1, 3, 4, 5, 6, 7 |
• Directed activities: lectures, case studies and exercises, lab sessions and seminars
• Supervised activities: tutorials
• Non-supervised activities: study, lab pre-work
Also, a 15-minute slot will be allocated in a lecture session to allow students filling the corresponding surveys for the evaluation of teaching quality.
Nota: se reservarán 15 minutos de una clase dentro del calendario establecido por el centro o por la titulación para que el alumnado rellene las encuestas de evaluación de la actuación del profesorado y de evaluación de la asignatura o módulo.
Título | Peso | Horas | ECTS | Resultados de aprendizaje |
---|---|---|---|---|
Lab report | 40% | 4 | 0,16 | 1, 2, 3, 4, 5, 6, 7 |
Partial exam 1 | 25% | 2 | 0,08 | 1, 3, 4, 5, 7, 8 |
Partial exam 2 | 25% | 2 | 0,08 | 1, 3, 4, 5, 7, 8 |
Remedial exam (only when required) | 50% | 2 | 0,08 | 1, 3, 4, 5, 7 |
Solved exercises | 10% | 2 | 0,08 | 3, 4, 5, 7 |
Progressive evaluation of the overall mark is based on the following weights:
• Two partial exams (25%+25%)
• Lab report (40%)
• Solved exercises (10%)
The above evaluation scheme is only applicable when marks for first and second items are greater or equal to 5/10.
If the combined mark for partial exams is less than 5/10, students can re-take a single exam (remedial exam) to recover that 50% of the overall mark.
Lab work (including sessions and report) is mandatory to pass evaluation and it can not be recovered.
Finally, students will be considered as absent (i.e. "No Presentat") if they do not attend lab sessions OR they are not present at the required exams.
Any change on the above evaluation method will be communicated in advance.
Materials supplied during class sessions are almost self-explanatori. For a deeper understanding of both theoretical and practical contents, the following readings are recommended:
• R. van de Plassche, CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters, Kluwer Academic Publishers
• R. Schreier and G. C. Temes, Understanding Delta-Sigma Data Converters, John Wiley & Sons
• V. Peluso, M. Steyaert and W. Sansen, Design of Low-Voltage and Low-Power CMOS Delta-Sigma A/D Converters, Kluwer Academic Publishers
• F. Medeiro, A. Pérez-Verdú and A. Rodríguez-Vázquez, Top-Down Design of High-Performance Sigma-Delta Modulators, Kluwer Academic Publishers
• T. Tuma and A. Burmen, Circuit Simulation with SPICE OPUS: Theory and Practice, Modeling and Simulation Science, Engineering and Technology, Birkhäuser Boston
• A. Hastings, The Art of Analog Layout, Pearson Prentice Hall
Academic Process Design Kit: CNM25 Edition
http://www.cnm.es/users/pserra/apdk
Developed by the own teachers.
La información sobre los idiomas de impartición de la docencia se puede consultar en el apartado de CONTENIDOS de la guía.