Titulació | Tipus | Curs |
---|---|---|
4313797 Enginyeria de Telecomunicació / Telecommunication Engineering | OB | 1 |
Podeu consultar aquesta informació al final del document.
In order to achieve the best understanding of syllabus contents, the following background is needed:
• Signal processing
• Circuit theory
• Electronic devices
• Analog CMOS circuits
The aim of this syllabus can be split into two goals:
• Introduction to the design of A/D and D/A data converters in CMOS technologies
• Hands-on experience on the design methodology and EDA tools for mixed-signal and full-custom integrated circuits.
Chapter 1. Introduction to integrated heterogeneous systems
1.1. Evolution of CMOS technologies
1.2. Trends in analog and mixed IC design
1.3. A/D and D/A conversion principles
1.4. ADC and DAC figures of merit
1.5. Lab proposal: My Delta-Sigma ADC in 2.5um CMOS technology (CNM25)
Chapter 2. ADC architectures and CMOS circuits
2.1. ADC classification
2.2. Flash techniques
2.3. Sub-ranging, time-interleaving and pipelining techniques
2.4. Successive-approximation techniques
2.5. Integrating techniques
2.6. Delta-Sigma modulation techniques
2.7. Time-domain techniques
Chapter 3. DAC architectures and CMOS circuits
3.1. DAC classification
3.2. Flash techniques
3.3. Pulse-width modulation techniques
3.4. Delta-Sigma modulation techniques
Chapter 4. Full-Custom IC Design Methodology
4.1. Mixed-Signal Design Flow
4.2. AMS Hardware Description Languages
4.3. Device Sizing
4.4. Process and Mismatching Simulation
4.5. The Art of Analog Layout
4.6. Physical Verification
4.7. Parasitics Extraction
4.8. DFM Techniques
(Seminar about CNM25 design kit)
Chapter 5. CMOS OpAmps
5.1. OpAmp Figures of Merit
5.2. The Mono-Transistor Amplifier
5.3. Differential Circuits with CMFB
5.4. Folded Amplifiers
5.5. Cascode Topologies
5.6. Gain Enhancement Techniques
5.7. Multi-Stage OpAmps
Chapter 6. Delta-Sigma Modulators for ADC
6.1. Oversampling and noise shaping principles
6.2. Architecture selection based on quantization error
6.3. Switched-capacitor CMOS implementations
6.4. Modeling circuit second order effects
6.5. Digitally assisted techniques
6.6. Low-power circuit topologies
Chapter 7. Application to Low-Power Read-Out ICs for Smart Sensors
7.1. High-resolution SC Delta-Sigma ADC for space applications
7.2. Compact pixel integrating ADC for infrared and X-ray imagers
7.3. Potentiostatic CT Delta-Sigma ADC for electrochemical integrated sensors
Títol | Hores | ECTS | Resultats d'aprenentatge |
---|---|---|---|
Tipus: Dirigides | |||
Case studies and exercises | 10 | 0,4 | 1, 3, 6, 7 |
Lab sessions | 12 | 0,48 | 1, 2, 3, 6, 7 |
Lectures | 23 | 0,92 | 3, 4, 5, 7 |
Tipus: Supervisades | |||
Tutorials | 15 | 0,6 | 1, 4, 5, 6 |
Tipus: Autònomes | |||
Lab pre-work | 10 | 0,4 | 1, 2, 4, 5, 6, 7 |
Study | 68 | 2,72 | 1, 3, 4, 5, 6, 7 |
• Directed activities: lectures, case studies and exercises, lab sessions and seminars
• Supervised activities: tutorials
• Non-supervised activities: study, lab pre-work
Also, a 15-minute slot will be allocated in a lecture session to allow students filling the corresponding surveys for the evaluation of teaching quality.
Nota: es reservaran 15 minuts d'una classe, dins del calendari establert pel centre/titulació, per a la complementació per part de l'alumnat de les enquestes d'avaluació de l'actuació del professorat i d'avaluació de l'assignatura/mòdul.
Títol | Pes | Hores | ECTS | Resultats d'aprenentatge |
---|---|---|---|---|
Lab report | 40% | 4 | 0,16 | 1, 2, 3, 4, 5, 6, 7 |
Partial exam 1 | 25% | 2 | 0,08 | 1, 3, 4, 5, 7, 8 |
Partial exam 2 | 25% | 2 | 0,08 | 1, 3, 4, 5, 7, 8 |
Remedial exam (only when required) | 50% | 2 | 0,08 | 1, 3, 4, 5, 7 |
Solved exercises | 10% | 2 | 0,08 | 3, 4, 5, 7 |
Progressive evaluation is based on the following weights:
• Two partial exams (25%+25%)
• Lab report (40%)
• Solved exercises (10%)
Lab work, including sessions and report, is mandatory to pass evaluation. The above evaluation scheme is only applicable when marks for first and second items are greater or equal to 5/10. Otherwise, a final exam is needed.
For those students going to the final exam, either due to low marks or for improvement, the resulting exam mark will weight 50%, together with the lab work (40%) and the solved exercises (10%).
Finally, students will be considered as absent (i.e. "No Presentat") if they do not attend lab sessions OR they are not present at the required exams.
Any change on the above evaluation method will be communicated in advance.
Materials supplied during class sessions are almost self-explanatori. For a deeper understanding of both theoretical and practical contents, the following readings are recommended:
• R. van de Plassche, CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters, Kluwer Academic Publishers
• R. Schreier and G. C. Temes, Understanding Delta-Sigma Data Converters, John Wiley & Sons
• V. Peluso, M. Steyaert and W. Sansen, Design of Low-Voltage and Low-Power CMOS Delta-Sigma A/D Converters, Kluwer Academic Publishers
• F. Medeiro, A. Pérez-Verdú and A. Rodríguez-Vázquez, Top-Down Design of High-Performance Sigma-Delta Modulators, Kluwer Academic Publishers
• T. Tuma and A. Burmen, Circuit Simulation with SPICE OPUS: Theory and Practice, Modeling and Simulation Science, Engineering and Technology, Birkhäuser Boston
• A. Hastings, The Art of Analog Layout, Pearson Prentice Hall
Academic Process Design Kit: CNM25 Edition
http://www.cnm.es/users/pserra/apdk
Developed by the own teachers.
La informació sobre els idiomes d’impartició de la docència es pot consultar a l’apartat de CONTINGUTS de la guia.